[
	{
		"key": "Abu-Zeid_1986",
		"type": "article",
		"TITLE": "Determination of the Thickness and Refractive Index of Cu$_2$O Thin Film Using Thermal and Optical\nInterferometry",
		"AUTHOR": "Abu-Zeid, M. E. and Rakhshani, A. E. and Al-Jassar, A. A. and Youssef, Y. A.",
		"JOURNAL": "Physica Status Solidi (a)",
		"YEAR": "1986",
		"PAGES": "613--620",
		"VOLUME": "93",
		"DOI": "10.1002/pssa.2210930226"
	}
]